Luxion demonstrates breakthrough in ray traced subsurface scattering at SIGGRAPH 2010

by | Jul 27, 2010

Los Angeles, California, July 27, 2010 -Luxion, the leading developer of advanced rendering and lighting technology and makers of KeyShot, the first realtime ray tracing and global illumination program, today announced a breakthrough in realtime ray traced subsurface scattering. This breakthrough makes it possible to render realistic natural materials such as human skin interactively and in realtime, without any approximations. The realtime ray traced subsurface scattering will be demonstrated as part of KeyShot 2.1 as one of several new developments at SIGGRAPH 2010, held from July 27 -29 at the Los Angeles Convention Center.

The subsurface scattering algorithms represent the next generation of the Academy Award winning work by Dr. Henrik Wann Jensen who is Chief Scientist at Luxion. Jensen’s algorithms have been essential in motion picture movies like “Lord of the Rings” and “Avatar”. Dr. Jensen and the team at Luxion achieved the breakthrough by using new sophisticated mathematical algorithms that make it possible to rapidly compute the effect of complex natural lighting on translucent materials.

Luxion’s latest developments can be seen in their own booth #1232, as well as in their partner booths’ INTEL #512 and ATI/AMD #301. To learn more about Siggraph 2010, visit https://

About Luxion
Luxion specializes in technology advancing state-of-the-art in computer based lightingsimulations. We have expert knowledge in areas related to daylighting (atmospheric scattering), light scattering by materials (BRDF and BSSRDF models), light transport algorithms such as photon mapping, and realtime rendering technology. We develop proprietary applications and libraries for customers in need for software capable of precisely calculating the scattering of light in complex 3D environments.

Press Contacts
Thomas Teger, VP of Marketing Luxion ApS
(714) 931-2498

KeyShot is a trademark of Luxion ApS. All other names mentioned herein are either trademarks or registered trademarks of their respective owners.